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Foreword about Professor Miloslav Ohlidal member of the International Scientific Editorial Board of "Advances in Electrical and Electronic Engineering" journal and the Professor at Department of Optics and Precise Mechanics, Institute of Physical Engineering, Faculty of Mechanical Engineering, Brno University of Technology:
"The aim of the editorial policy of AEEE journal is to facilitate contacts between research centers and the industry within a wide range of scientific disciplines, including physics and optics. As a person who deals with optics of thin films, let me briefly mention here the importance of this discipline for the technological growth of our society. Generally, the use of these films is really multidisciplinary. For example, they serve as elements of various electronics systems, thin film coatings play important role in mechanical engineering, and their optical properties are utilized for example in optical, photovoltaic, automotive and jewelry industries. This fact is a powerful stimulant for the development of thin films with the new properties required by the above-mentioned technical practice. From another point of view, such new films also allow the creation of an unlimited variety of new advanced device structures which are developing in the academic research. Therefore, it is necessary to have reliable methods to characterize these properties. Regarding the films which are intended for optical applications, there are plenty of such methods determining the film optical parameters (today the number of them is certainly more than 100). Among them the variable angle spectroscopic ellipsometry (VASE) and spectrophotometry (SP) are the most often used. It is frequently valuable to combine those optical methods of thin film characterization with non-optical methods like, for example, scanning or transmission electron microscopy, scanning probe microscopy, energy dispersive X-ray spectroscopy etc. As a part of new trends in the field of thin films characterization can be mentioned trends characterized by an endeavor to include various film defects in the process of the evaluation of the film optical parameters. The development of imaging versions of VASE and SP can also be included in these trends"
Table of Contents
Electrical and Electronic Engineering
| Fuzzy Sliding Mode Control Based on Backstepping Synthesis for Unmanned Quadrotors |
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| Ali Medjghou, Noureddine Slimane, Kheireddine Chafaa | 135 - 146 |
| DOI: 10.15598/aeee.v16i2.2231 |
| Interleaved DC/DC Boost Converter with Coupled Inductors |
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| Slavomir Kascak, Michal Prazenica, Miriam Jarabicova, Marek Paskala | 147 - 154 |
| DOI: 10.15598/aeee.v16i2.2413 |
| Transient Fault Area Location and Fault Classification for Distribution Systems Based on Wavelet Transform and Adaptive Neuro-Fuzzy Inference System (ANFIS) |
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| Ali Khaleghi, Mahmood Oukati Sadegh, Mahdi Ghazizadeh-Ahsaee, Alireza Mehdipour Rabori | 155 - 166 |
| DOI: 10.15598/aeee.v16i2.2563 |
| Design of Multi-Nanoparticles Technique for Enhancing Magnetic Characterization of Power Transformers Cores |
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| Ahmed Thabet, Safaa Abdelhady, Abdel-Moamen Mohammed Abdel-Rahim | 167 - 177 |
| DOI: 10.15598/aeee.v16i2.2354 |
| Enabling D2D Transmission Mode with Energy Harvesting and Information Transfer in Heterogeneous Networks |
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| Hong Nhu Nguyen, Huu Phuc Dang, Si Phu Le, Thanh Duc Le, Dinh Thuan Do, Miroslav Voznak, Jaroslav Zdralek | 178 - 184 |
| DOI: 10.15598/aeee.v16i2.2393 |
| Gap Coupled Dual-Band Petal Shape Patch Antenna for WLAN / WiMAX Applications |
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| Brijesh Mishra, Vivek Singh, Rajeev Singh | 185 - 198 |
| DOI: 10.15598/aeee.v16i2.2416 |
| Design of an Open Hardware Bridge Between Robots and ROS/non-ROS Environments |
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| Yves Bergeon, Vaclav Krivanek | 199 - 204 |
| DOI: 10.15598/aeee.v16i2.2439 |
| Regulated Electric Drainage and its Interference with Track Circuits |
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| Vaclav Kolar, Roman Hrbac, Tomas Mlcak, Vitezslav Styskala | 205 - 210 |
| DOI: 10.15598/aeee.v16i2.2478 |
| Track Occupancy Detection Using Ratio of Open-Circuit Impedance to Short-Circuit Impedance |
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| Lubomir Ivanek, Petr Orsag, Vladimir Mostyn, Karel Schee | 211 - 217 |
| DOI: 10.15598/aeee.v16i2.2662 |
| Failure Analysis of Current and Future Electricity Meters and their Components in Relation to the Costs of Ownership |
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| Ondrej Mamula, Lenka Mejzrova, Jiri Vodrazka | 218 - 225 |
| DOI: 10.15598/aeee.v16i2.2557 |
Physics and Optics
| Analysis of BDMOS and DTMOS Current Mirrors in 130 nm CMOS Technology |
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| Matej Rakus, Viera Stopjakova, Daniel Arbet | 226 - 232 |
| DOI: 10.15598/aeee.v16i2.2747 |
| 3D Photonic Crystals for Direct Applications in Light Emitting Devices |
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| Matej Goraus, Petra Urbancova, Dusan Pudis | 233 - 238 |
| DOI: 10.15598/aeee.v16i2.2750 |
| Electrodeposition of Cuprous Oxide on Boron Doped Diamond Electrodes |
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| Miroslav Behul, Marian Vojs, Marian Marton, Pavol Michniak, Mario Kurniawan, Ralf Peipmann, Codruta Aurelia Vlaic, Andreas Bund, Robert Redhammer | 239 - 245 |
| DOI: 10.15598/aeee.v16i2.2778 |
| Substrate Effect in Electron Beam Lithography |
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| Kornelia Indykiewicz, Bogdan Paszkiewicz, Regina Paszkiewicz | 246 - 252 |
| DOI: 10.15598/aeee.v16i2.2746 |
