Helpdesk

Top image

Editorial board

Juraj Altus
University of Zilina, Slovakia

Alexander Argyros
The University of Sydney, Australia

Radu Arsinte
Technical University of Cluj Napoca, Romania

Ivan Baronak
Slovak University of Technology, Slovakia

Dalibor Biolek
University of Defence, Czech Republic

Klara Capova
University of Zilina, Slovakia

Ray-Guang Cheng
National Taiwan University of Science and Technology, Taiwan, Province of China

Erik Chromy
UPC Broadband Slovakia, Slovakia

Frantisek Cvachovec
University of Defence, Czech Republic

Annraoi M de Paor
University College Dublin, Ireland

Milan Dado
University of Zilina, Slovakia

Zdenek Divis
VSB - Technical University of Ostrava, Czech Republic

Petr Drexler
Brno University of Technology, Czech Republic

Pavel Fiala
Brno University of Technology, Czech Republic

Eva Gescheidtova
Brno University of Technology, Czech Republic

Valeria Hrabovcova
University of Zilina, Slovakia

Gokhan Hakki Ilk
Ankara University, Turkey

Rene Kalus
VSB - Technical University of Ostrava, Czech Republic

Ivan Kasik
Academy of Sciences of the Czech Republic, Czech Republic

Vladimir Kasik
VSB - Technical University of Ostrava, Czech Republic

Jan Kohout
University of Defence, Czech Republic

Pavel Koktavy
Brno University of Technology, Czech Republic

Ondrej Krejcar
University of Hradec Kralove, Czech Republic

Igor Piotr Kurytnik
University of Bielsko-Biala, Poland

Miroslaw Luft
Technical University of Radom, Poland

Stanislav Marchevsky
Technical University of Kosice, Slovakia

Luigi Martirano
University of Rome "La Sapienza", Italy

Jerzy Mikulski
University of Economics in Katowice, Katowice, Poland

Karol Molnar
Honeywell International, Czech Republic

Miloslav Ohlidal
Brno University of Technology, Czech Republic

Ibrahim Taner Okumus
Sutcu Imam University, Turkey

Milos Orgon
Slovak University of Technology, Slovakia

Marek Penhaker
VSB - Technical University of Ostrava, Czech Republic

Wasiu Oyewole Popoola
The University of Edinburgh, United Kingdom

Roman Prokop
Tomas Bata University in Zlin, Czech Republic

Karol Rastocny
University of Zilina, Slovakia

Marie Richterova
University of Defence, Czech Republic

Gheorghe Sebestyen-Pal
Technical University of Cluj Napoca, Romania

Sergey Vladimirovich Serebriannikov
National Research University "MPEI", Russian Federation

Yuriy Shmaliy
Guanajuato University, Mexico

Vladimir Schejbal
University of Pardubice, Czech Republic

Bohumil Skala
University of West Bohemia in Plzen, Czech Republic

Lorand Szabo
Technical University of Cluj Napoca, Romania

Adam Szelag
Warsaw University of Technology, Poland

Ahmadreza Tabesh
Isfahan University of Technology, Iran, Islamic Republic Of

Mauro Tropea
DIMES Department of University of Calabria, Italy

Pavel Vaclavek
Brno University of Technology, Czech Republic

Martin Vaculik
University of Zilina, Slovakia

Viktor Valouch
Academy of Sciences of the Czech Republic, Czech Republic

Vladimir Vasinek
VSB - Technical University of Ostrava, Czech Republic

Jiri Vodrazka
Czech Technical University in Prague, Czech Republic

Miroslav Voznak
VSB - Technical University of Ostrava, Czech Republic

Otakar Wilfert
Brno University of Technology, Czech Republic

Jan Zidek
VSB - Technical University of Ostrava, Czech Republic


Home Search Mail RSS


Table of Contents

Electrical and Electronic Engineering

X-Ray Diffractometry of Thin Layers - Possibilities and Problems flash_logo_35
55 - 57
Traps in Zirconium Alloys Oxide Layers flash_logo_35 flash_logo_35
58 - 62
The Effect of Substitution of Fe By Co on Rapidly Quenched (FeCo)MoCuB Amorphous Alloys flash_logo_35
63 - 66
Performance of AlGaN/GaN Heterostructure Field-Effect Transistors for High-Frequency and High-Power Electronics flash_logo_35
67 - 70
Conversion of Dielectric Data from the Time Domain to the Frequency Domain flash_logo_35
71 - 74
Geard-Ring and Charge Collection Efficiency of GaAs Detector flash_logo_35
75 - 78
Sims Characterisation of ZnO Layer Prepared By Pulsed Laser Deposition flash_logo_35
79 - 82
Influence of Magnetic Field on Electric Charge Transport in Holomiun Thin Films at Low Temperatures flash_logo_35
83 - 86
Complex Imaging of Photorefractive Records flash_logo_35
87 - 92
Orgin of Slag from Early Medieval Age Furnaces in Nitra flash_logo_35
93 - 96
Spectral Investigation of Laser Structures using NSOM Experiment flash_logo_35
97 - 100
Nanotubes as Cold Cathode Elements flash_logo_35
101 - 102
First-Order Phase Transitions in Finite Systems II: Weak Boundary Conditions flash_logo_35
103 - 106