Helpdesk

Top image

Editorial board

Darius Andriukaitis
Kaunas University of Technology, Lithuania

Alexander Argyros
The University of Sydney, Australia

Radu Arsinte
Technical University of Cluj Napoca, Romania

Ivan Baronak
Slovak University of Technology, Slovakia

Khosrow Behbehani
The University of Texas at Arlington, United States

Mohamed El Hachemi Benbouzid
University of Brest, France

Dalibor Biolek
University of Defence, Czech Republic

Klara Capova
University of Zilina, Slovakia

Ray-Guang Cheng
National Taiwan University of Science and Technology, Taiwan, Province of China

Erik Chromy
UPC Broadband Slovakia, Slovakia

Milan Dado
University of Zilina, Slovakia

Petr Drexler
Brno University of Technology, Czech Republic

Eva Gescheidtova
Brno University of Technology, Czech Republic

Gokhan Hakki Ilk
Ankara University, Turkey

Janusz Jezewski
Institute of Medical Technology and Equipment, Poland

Rene Kalus
VSB - Technical University of Ostrava, Czech Republic

Ivan Kasik
Academy of Sciences of the Czech Republic, Czech Republic

Jan Kohout
University of Defence, Czech Republic

Ondrej Krejcar
University of Hradec Kralove, Czech Republic

Zbigniew Leonowicz
Wroclaw University of Science and Technology, Poland

Miroslaw Luft
Technical University of Radom, Poland

Stanislav Marchevsky
Technical University of Kosice, Slovakia

Jerzy Mikulski
University of Economics in Katowice, Katowice, Poland

Karol Molnar
Honeywell International, Czech Republic

Miloslav Ohlidal
Brno University of Technology, Czech Republic

Neeta Pandey
Delhi Technological University, India

Alex Noel Joseph Raj
Shantou University, China

Marek Penhaker
VSB - Technical University of Ostrava, Czech Republic

Wasiu Oyewole Popoola
The University of Edinburgh, United Kingdom

Roman Prokop
Tomas Bata University in Zlin, Czech Republic

Karol Rastocny
University of Zilina, Slovakia

Marie Richterova
University of Defence, Czech Republic

Gheorghe Sebestyen-Pal
Technical University of Cluj Napoca, Romania

Sergey Vladimirovich Serebriannikov
National Research University "MPEI", Russian Federation

Yuriy Shmaliy
Guanajuato University, Mexico

Vladimir Schejbal
University of Pardubice, Czech Republic

Bohumil Skala
University of West Bohemia in Plzen, Czech Republic

Lorand Szabo
Technical University of Cluj Napoca, Romania

Adam Szelag
Warsaw University of Technology, Poland

Ahmadreza Tabesh
Isfahan University of Technology, Iran, Islamic Republic Of

Mauro Tropea
DIMES Department of University of Calabria, Italy

Viktor Valouch
Academy of Sciences of the Czech Republic, Czech Republic

Jiri Vodrazka
Czech Technical University in Prague, Czech Republic

Miroslav Voznak
VSB - Technical University of Ostrava, Czech Republic

He Wen
Hunan University, China

Otakar Wilfert
Brno University of Technology, Czech Republic


Home Search Mail RSS


Global Contrast Enhancement Based Image Forensics Using Statistical Features

Neetu Singh, Abhinav Gupta, Roop Chand Jain

DOI: 10.15598/aeee.v15i3.2189


Abstract

The evolution of modern cameras, mobile phones equipped with sophisticated image editing software has revolutionized digital imaging. In the process of image editing, contrast enhancement is a very common technique to hide visual traces of tampering. In our work, we have employed statistical distribution of block variance and AC DCT coefficients of an image to detect global contrast enhancement in an image. The variation in statistical parameters of block variance and AC DCT coefficients distribution for different degrees of contrast enhancement are used as features to detect contrast enhancement. An SVM classifier with 10-fold cross-validation is employed. An overall accuracy greater than 99% in detection with false rate less than 2% has been achieved. The proposed method is novel and it can be applied to uncompressed, previously JPEG compressed and post enhancement JPEG compressed images with high accuracy. The proposed method does not employ oft-repeated image histogram-based approach.

Keywords


AC DCT coefficients; block variance; contrast enhancement forensics.

Full Text:

PDF